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Miny, T.; Heppner, S.; Garmaev, I.; Kleinert, T.; Ristin, M.; Wernher van de Venn, H.; Otto, B.; Meinecke, K.; Diedrich, C.; Braunisch, N.; Wollschlaeger, M. (2022). Semi-Automatic Testing of Data-Focused Software Development Kits for Industrie 4.0, INDIN 2022 - IEEE International Conference on Industrial Informatics, 25.-28.07.2022, IEEE, Perth, Australien/virtuell