Semi-Automatic Testing of Data-Focused Software Development Kits for Industrie 4.0

Author:

T. Miny

S. Heppner

I. Garmaev

T. Kleinert

M. Ristin

H. Wernher van de Venn

B. Otto

K. Meinecke

C. Diedrich

N. Braunisch

M. Wollschlaeger

Year of Conference:

2022

Conference Name:

INDIN 2022 - IEEE International Conference on Industrial Informatics, 25.-28.07.2022

Date Published:

07/2022

Publisher:

IEEE

Conference Location:

Perth, Australien/virtuell

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Geschäftsfelder:

Transport & Assistance

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