Publikationen

Maturity Evaluation of SDKs for I4.0 Digital Twins

Author:
N. Braunisch
R. Lehmann
M. Wollschlaeger
M. Ristin
H. Wernher van de Venn
B. Otto
T. Kleinert
Year of Conference:
2023
Conference Name:
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), 12.-15.09.2023
Date Published:
09/2023
Publisher:
IEEE
Conference Location:
Sinaia, Rumänien
DOI:
10.1109/ETFA54631.2023.10275719
Geschäftsfelder: