Publikationen

Code and Test Generation for I4.0 State Machines with LLM-based Diagram Recognition

Author:
B. Otto
A. Aidarkhan
M. Ristin
N. Braunisch
C. Diedrich
H. Wernher van de Venn
Year of Conference:
2025
Conference Name:
IEEE International Workshop on Factory Communication Systems (WFCS), 10.-13.06.2025
Date Published:
07/2025
Publisher:
IEEE
Conference Location:
Rostock
ISSN Number:
2835-8414 (Electronic), 2835-8511 (Print)
ISBN Number:
979-8-3315-3005-1 (Electronic), 979-8-3315-3006-8 (Print)
DOI:
https://doi.org/10.1109/WFCS63373.2025.11077624
Geschäftsfelder: